Sunday, August 17, 2014

Thin-Film Characterization Suggestion

Thin-films that comprise solar panels are an extremely sensitive material, which brings a huge importance of monitoring their production parameters. The entire procedure of obtaining these measurements of thin-film characterization is known as thin-film metrology. There’re many parameters that must be considered during thin-film analysis. The basic variables such as light, electrons, ions, neutrons, etc. must be taken into account. Even knowing what must be measured, and what standards to conform to could be challenging in real-time operation. When so many components must be accounted for, one must depend upon the tools that deliver optimal results fast. K-Space has years of experience in the field of thin-film characterization, and posses wide-range pool of highly developed tools.